Effect of Electron-Beam Irradiation on Organic Semiconductor and Its Application for Transistor-Based Dosimeters
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Jae Joon | ko |
| dc.contributor.author | Ha, Jun Mok | ko |
| dc.contributor.author | Lee, Hyeok Moo | ko |
| dc.contributor.author | Raza, Hamid Saeed | ko |
| dc.contributor.author | Park, Ji Won | ko |
| dc.contributor.author | Cho, Sung-Oh | ko |
| dc.date.accessioned | 2016-10-07T09:28:46Z | - |
| dc.date.available | 2016-10-07T09:28:46Z | - |
| dc.date.created | 2016-10-05 | - |
| dc.date.created | 2016-10-05 | - |
| dc.date.created | 2016-10-05 | - |
| dc.date.issued | 2016-08 | - |
| dc.identifier.citation | ACS APPLIED MATERIALS & INTERFACES, v.8, no.30, pp.19192 - 19196 | - |
| dc.identifier.issn | 1944-8244 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/213231 | - |
| dc.description.abstract | The effects of electron-beam irradiation on the organic semiconductor rubrene and its application as a dosimeter was investigated. Through the measurements of photoluminescence and the ultraviolet photoelectron spectroscopy, we found that electron-beam irradiation induces n-doping of rubrene. Additionally, we fabricated rubrene thin-film transistors with pristine and irradiated rubrene, and discovered that the decrease in transistor properties originated from the irradiation of rubrene and that the threshold voltages are shifted to the opposite directions as the irradiated layers. Finally, a highly sensitive and air-stable electron dosimeter was fabricated based on a rubrene transistor | - |
| dc.language | English | - |
| dc.publisher | AMER CHEMICAL SOC | - |
| dc.title | Effect of Electron-Beam Irradiation on Organic Semiconductor and Its Application for Transistor-Based Dosimeters | - |
| dc.type | Article | - |
| dc.identifier.wosid | 000380968300002 | - |
| dc.identifier.scopusid | 2-s2.0-84982701941 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 8 | - |
| dc.citation.issue | 30 | - |
| dc.citation.beginningpage | 19192 | - |
| dc.citation.endingpage | 19196 | - |
| dc.citation.publicationname | ACS APPLIED MATERIALS & INTERFACES | - |
| dc.identifier.doi | 10.1021/acsami.6b05555 | - |
| dc.contributor.localauthor | Cho, Sung-Oh | - |
| dc.contributor.nonIdAuthor | Lee, Hyeok Moo | - |
| dc.contributor.nonIdAuthor | Raza, Hamid Saeed | - |
| dc.contributor.nonIdAuthor | Park, Ji Won | - |
| dc.description.isOpenAccess | N | - |
| dc.type.journalArticle | Article | - |
| dc.subject.keywordAuthor | electron-beam irradiation | - |
| dc.subject.keywordAuthor | rubrene | - |
| dc.subject.keywordAuthor | organic thin-film transistor | - |
| dc.subject.keywordAuthor | dosimeter | - |
| dc.subject.keywordAuthor | semiconductor doping | - |
| dc.subject.keywordPlus | RUBRENE THIN-FILMS | - |
| dc.subject.keywordPlus | RADIATION DETECTORS | - |
| dc.subject.keywordPlus | SINGLE-CRYSTALS | - |
| dc.subject.keywordPlus | POLYSTYRENE | - |
| dc.subject.keywordPlus | DAMAGE | - |
- Appears in Collection
- NE-Journal Papers(저널논문)
- Files in This Item
- There are no files associated with this item.
This item is cited by other documents in WoS
| ⊙ Detail Information in WoSⓡ | Click to see |  |
| ⊙ Cited 16 items in WoS | Click to see citing articles in |  |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.