Suppressing Lateral Conduction Loss of Thin-film Cathode by Inserting a Denser Bridging Layer

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To reduce the lateral conduction loss of thin-film-processed cathodes, the microstructure of the thin-film cathode is engineered to contain a denser bridging layer in the middle. By doing so, the characteristic crack-like pores that separate the cathode domains in thin-film-processed cathodes and hamper lateral conduction are better connected and, as a result, the sheet resistance of the cathode is effectively reduced by a factor of 5. This induces suppression of the lateral conduction loss and expansion of the effective current collecting area; the cell performance is improved by more than 30%.
Publisher
KOREAN CERAMIC SOC
Issue Date
2015-09
Language
English
Article Type
Article
Citation

JOURNAL OF THE KOREAN CERAMIC SOCIETY, v.52, no.5, pp.304 - 307

ISSN
1229-7801
DOI
10.4191/kcers.2015.52.5.304
URI
http://hdl.handle.net/10203/209122
Appears in Collection
EEW-Journal Papers(저널논문)
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