One-Cycle Correction of Timing Errors in Pipelines With Standard Clocked Elements

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dc.contributor.authorShin, Insupko
dc.contributor.authorKim, Jae Joonko
dc.contributor.authorLin, Yu Shiangko
dc.contributor.authorShin, Youngsooko
dc.date.accessioned2016-06-07T09:00:07Z-
dc.date.available2016-06-07T09:00:07Z-
dc.date.created2015-11-23-
dc.date.created2015-11-23-
dc.date.issued2016-02-
dc.identifier.citationIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v.24, no.2, pp.600 - 612-
dc.identifier.issn1063-8210-
dc.identifier.urihttp://hdl.handle.net/10203/207674-
dc.description.abstractOne of the most aggressive uses of dynamic voltage scaling is timing speculation, which in turn requires fast correction of timing errors. The fastest existing error correction technique imposes a one-cycle time penalty only, but it is restricted to two-phase transparent latch-based pipelines. We perform one-cycle error correction by gating only the main latch in each stage of the pipeline that precedes a failed stage. This new method is applicable to widely used clocking elements, such as flip-flops and pulsed latches. Because it prevents inputs arriving at a stage, which is stalled, it can also be used in pipelines with multiple fan-in, fan-out, and looping. Simulations show an energy saving of 8%-12% with a target throughput of 0.9 instructions per cycle, and 15%-18% when the target is 0.8.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectDYNAMIC VARIATION TOLERANCE-
dc.subjectPOWER-
dc.subjectMICROPROCESSOR-
dc.subjectVOLTAGE-
dc.subjectSYSTEM-
dc.titleOne-Cycle Correction of Timing Errors in Pipelines With Standard Clocked Elements-
dc.typeArticle-
dc.identifier.wosid000369479500017-
dc.identifier.scopusid2-s2.0-84925872430-
dc.type.rimsART-
dc.citation.volume24-
dc.citation.issue2-
dc.citation.beginningpage600-
dc.citation.endingpage612-
dc.citation.publicationnameIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS-
dc.identifier.doi10.1109/TVLSI.2015.2409118-
dc.contributor.localauthorShin, Youngsoo-
dc.contributor.nonIdAuthorKim, Jae Joon-
dc.contributor.nonIdAuthorLin, Yu Shiang-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorError correction-
dc.subject.keywordAuthorlow-voltage operation-
dc.subject.keywordAuthortiming speculation-
dc.subject.keywordPlusDYNAMIC VARIATION TOLERANCE-
dc.subject.keywordPlusPOWER-
dc.subject.keywordPlusMICROPROCESSOR-
dc.subject.keywordPlusVOLTAGE-
dc.subject.keywordPlusSYSTEM-
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