X-ray Inspection System with Two Flat Panel Detectors for Extra-large Object Inspection
- Publisher
- IEEE NSS/MIC
- Issue Date
- 2015-11-03
- Language
- English
- Citation
2015 IEEE Nuclear Science Symposium and Medical Imaging Conference
- Appears in Collection
- NE-Conference Papers(학술회의논문)
- Files in This Item
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.