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Results 1-10 of 34 (Search time: 0.002 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
Quantized Canductance of a Gate-All-Around Silicon Quantum Wire Transistor

Hyung-Cheol Shinresearcher, MNC(Microprocesses and Nanotechnology Conference, pp.150 - 151, 1998

2
Fabrication of siliocon Quantum Dots on Oxide and Nitride

Hyung-Cheol Shinresearcher, MNC(Microproceses and Nanotechnology Conference), pp.136 - 137, 1998

3
Characteristics of Thermal Nitride Grown by IR Furnace

Hyung-Cheol Shinresearcher, IUMRS-ICEM-98, pp.106 - 106, 1998

4
Characterization of Thin Oxide Damage During Aluminum Etching and Photoresist Ashing Processes

Hyung-Cheol Shinresearcher, International Symposium on VLSI Technology,Systems and Applications, pp.210 - 213, 1991

5
Effect of Body Structure on Analog Performance of SOI NMOSFET's

Hyung-Cheol Shinresearcher, IEEE SOI Conference, pp.61 - 62, 1998

6
Silicon nano-crystal memory with tunneling nitride

Hyung-Cheol Shinresearcher, International Conference on Solid State Devices and Materials, pp.170 - 171, 1998

7
Factors Affecting Charge-up in a Magnetically Enhanced RIE Polysilicon Etcher

Hyung-Cheol Shinresearcher, Proc. Electrochemical Society, pp.405 - 406, 1993

8
Thin Oxide Damage by Plasma Etching and Ashing Processes

Hyung-Cheol Shinresearcher, Proc. IEEE International Reliability Phys. Symp., pp.37 - 41, 1992

9
Characterization of Process-Induced Damage During Aluminum Etching and Photoresist Ashing

Hyung-Cheol Shinresearcher, International Wafer Level Reliability Workshop, pp.133 - 144, 1991

10
A nano-structure Memory with SOI Edge channel and A nano dot

Hyung-Cheol Shinresearcher, MNC(Microproceses and Nanotechnology Conference), pp.315 - 316, 1998

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