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Results 21-30 of 60 (Search time: 0.004 seconds).
| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Thickness and Other Defects on Oxide and Interface Reliability due to Plasma Processing Hyung-Cheol Shin, Proc. IEEE International Reliability Phys. Symp., pp.272 - 279, 1993 | |
| A self-assembled silicon quantum dot transistor operation at room temperature Hyung-Cheol Shin, 1998 ASIAN SCIENCE SEMINAR, 1998 | |
| Two Band Tunneling Currents in Dual-Gate CMOSFET with Ultrathin Gate Oxide Hyung-Cheol Shin, ICSMM 2000, pp.108 - 109, 2000 | |
| TFSOI Complementary BiCMOS Technology for Low Power RF Mixed-Mode Applications Hyung-Cheol Shin, IEEE Custom Integrated Circuits Conference, pp.35 - 38, 1996 | |
| Materials, Device and Gate Oxide Integrith Evaluation of Simox and Bonded SOI Wafers Hyung-Cheol Shin, Proc. IEEE International SOI Conference, pp.143 - 145, 1995 | |
| Integrity of Gate Oxide on TFSOI Materials Hyung-Cheol Shin, Proc. IEEE International SOI Conference, pp.22 - 23, 1995 | |
| Physical RF modeling of Junction Varactors Hyung-Cheol Shin, SSDM 2002, pp.418 - 419, 2002 | |
| 50 nm MOSFET with Floating Polysilicon Spacer Hyung-Cheol Shin, IEEE Silicon Nanoelectronics Workshop, pp.54 - 55, 2001 | |
| PMOS-based Si Nano-crystal Memory Hyung-Cheol Shin, Silicon nanoelectronics workshop, pp.10 - 11, 1999 | |
| A New Curvature-Compensated CMOS Bandgap Reference with Low Power Consumption Hyung-Cheol Shin, ITC-CSCC 2000, pp.612 - 614, 2000 |
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- 26 2000 - 2003
- 34 1991 - 1999