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Results 51-60 of 60 (Search time: 0.003 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
51
A 5-GHz Band I/Q Generator using a Self-Calibration Technique

Beom-Sup Kimresearcher; Hyung-Cheol Shinresearcher, European Solid-State Circuit Conference, pp.807 - 810, 2002

52
A Tri-Gate MOSFET with Gate-to-Source/Drain Non-overlapped Structure for 5 nm Regime

Hyung-Cheol Shinresearcher, Silicon Nanoelectronics Workshop 2003, pp.32 - 33, 2003

53
The P-Channel Si Nano-Crystal Memory

Hyung-Cheol Shinresearcher, ICSICT 2001, pp.200 - 204, 2001

54
Physical Modeling of Substrate Resistance in RF MOSFETs

Hyung-Cheol Shinresearcher, Workshop on Compact Modeling at the 5th International Conference on Modeling and Simulation of Microsystems, pp.335 - 338, 2003

55
Characterization of oxide Charging in a Magnetically Enhanced Rie Polysilicon Etcher

Hyung-Cheol Shinresearcher, Proc. 11th International Syposium on Plasma Chemistry, pp.1534 - 1539, 1993

56
Gate Oxide Damage by Plasma Oxide Deposition and Via RIE

Hyung-Cheol Shinresearcher, American Vacuum Society Plasma Etch 1992 Symposium, 1992

57
Impact of Plasma Charging Damage and Diode Protection on Scaled Thin Oxide

Hyung-Cheol Shinresearcher, IEDM Technical Digest, pp.467 - 470, 1993

58
Plasma-Etching induced Damage to Thin Oxide

Hyung-Cheol Shinresearcher, IEEE/SEMI Advanced Semiconductor Manufacturing Conference, pp.79 - 83, 1992

59
A Model of Thin Oxide Damage by Plasma Etching and Ashing Processes

Hyung-Cheol Shinresearcher, Plasma Etch, pp.27 - 29, 1991

60
RF characteristics of 30 nm MOSFETs with non-overlapped source-drain to gate

Hyung-Cheol Shinresearcher, Silicon Nanoelectronics Workshop 2002, 2002

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