DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Byeong Hoon | ko |
dc.contributor.author | Byun, Chun Won | ko |
dc.contributor.author | Yoon, Sung-Min | ko |
dc.contributor.author | Yang, Shin Hyuk | ko |
dc.contributor.author | Jung, Soon-Won | ko |
dc.contributor.author | Ryu, Min Ki | ko |
dc.contributor.author | Park, Sang-Hee Ko | ko |
dc.contributor.author | Hwang, Chi-Sun | ko |
dc.contributor.author | Cho, Kyoung-Ik | ko |
dc.contributor.author | Kwon, Oh-Sang | ko |
dc.contributor.author | Park, Eun-Suk | ko |
dc.contributor.author | Oh, Him Chan | ko |
dc.contributor.author | Kim, Kyoung-Hwan | ko |
dc.contributor.author | Park, Kee Chan | ko |
dc.date.accessioned | 2015-11-20T12:46:57Z | - |
dc.date.available | 2015-11-20T12:46:57Z | - |
dc.date.created | 2014-04-17 | - |
dc.date.created | 2014-04-17 | - |
dc.date.issued | 2011-03 | - |
dc.identifier.citation | IEEE ELECTRON DEVICE LETTERS, v.32, no.3, pp.324 - 326 | - |
dc.identifier.issn | 0741-3106 | - |
dc.identifier.uri | http://hdl.handle.net/10203/201694 | - |
dc.description.abstract | A new ferroelectric memory array on a glass substrate has been developed using In-Ga-Zn-O (IGZO) thin-film transistors (TFTs). Each memory cell is composed of two normal IGZO TFTs and a ferroelectric TFT (FeTFT). Poly(vinylidene fluoride-trifluoroethylene) [P(VDF-TrFE)] is employed as the gate dielectric layer of the FeTFT. All the fabrication processes were performed below 200 degrees C. The fabricated memory successfully demonstrated disturb-free write/readout operation. The current ratio between the 1 and 0 states is about 10(4). | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | Oxide-Thin-Film-Transistor-Based Ferroelectric Memory Array | - |
dc.type | Article | - |
dc.identifier.wosid | 000287658400034 | - |
dc.identifier.scopusid | 2-s2.0-79951952324 | - |
dc.type.rims | ART | - |
dc.citation.volume | 32 | - |
dc.citation.issue | 3 | - |
dc.citation.beginningpage | 324 | - |
dc.citation.endingpage | 326 | - |
dc.citation.publicationname | IEEE ELECTRON DEVICE LETTERS | - |
dc.identifier.doi | 10.1109/LED.2010.2096197 | - |
dc.contributor.localauthor | Park, Sang-Hee Ko | - |
dc.contributor.nonIdAuthor | Kim, Byeong Hoon | - |
dc.contributor.nonIdAuthor | Byun, Chun Won | - |
dc.contributor.nonIdAuthor | Yoon, Sung-Min | - |
dc.contributor.nonIdAuthor | Yang, Shin Hyuk | - |
dc.contributor.nonIdAuthor | Jung, Soon-Won | - |
dc.contributor.nonIdAuthor | Ryu, Min Ki | - |
dc.contributor.nonIdAuthor | Hwang, Chi-Sun | - |
dc.contributor.nonIdAuthor | Cho, Kyoung-Ik | - |
dc.contributor.nonIdAuthor | Kwon, Oh-Sang | - |
dc.contributor.nonIdAuthor | Park, Eun-Suk | - |
dc.contributor.nonIdAuthor | Oh, Him Chan | - |
dc.contributor.nonIdAuthor | Kim, Kyoung-Hwan | - |
dc.contributor.nonIdAuthor | Park, Kee Chan | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Disturb-free | - |
dc.subject.keywordAuthor | ferroelectric memory | - |
dc.subject.keywordAuthor | In-Ga-Zn-O (IGZO) | - |
dc.subject.keywordAuthor | thin-film transistor (TFT) | - |
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