Browse "School of Mechanical and Aerospace Engineering(기계항공공학부)" by Subject Phase shifting interferometry
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| Determination of film thickness and surface profile using reflectometry and spectrally resolved phase shifting interferometry You, Joonho; Debnath, Sanjit Kumar; Kim, Seung-Woo, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.10, no.5, pp.5 - 10, 2009-12 |
| Phase shifting interferometry for large-sized surface measurements by sweeping the repetition rate of femtosecond light pulses Joo, Woo-Deok; Park, Ji-Yong; Kim, Seung-Man; Kim, Seung-Chul; Kim, Yun-Seok; Kim, Seung-Woo; KIM, Young-Jin, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.14, no.2, pp.241 - 246, 2013-02 |
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