Browse "School of Electrical Engineering(전기및전자공학부)" by Subject joint path failure

Showing results 1 to 1 of 1

1
A spare bandwidth sharing scheme based on network reliability

Sohn, KS; Nam, SY; Sung, Dan Keun, IEEE TRANSACTIONS ON RELIABILITY, v.54, no.1, pp.123 - 132, 2005-03

Discover

Type

Open Access

Date issued

. next

Subject

. next

rss_1.0 rss_2.0 atom_1.0