Browse "School of Electrical Engineering(전기및전자공학부)" by Title 

Showing results 36361 to 36380 of 51043

36361
The effect of void on characteristics of LDMOS power amplifier

Son, Mi-Hyun; Bae, Sooho; Park, Hyuncheol; Kwon, Hyuck M., MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.58, no.3, pp.691 - 694, 2016-03

36362
The Effect of x-Ray Irradiation-Induced Damage on Reliability in MOS Structures

Shi-Ho Kim; Ho-Jun Lee; Chul-Hi Han; Lee, Kwyro; Sang-Soo Choi; Young-Jin Jeon; Enzo Di Fabrizio; et al, SOLID STATE ELECTRONICS, 1994-09

36363
The effect on the sum rate of base stations with an unlimited number of dual polarized antennas in wireless backhaul cellular networks = 무선 백홀 통신망 내에서 무수히 많은 이중 편파 안테나를 가지는 기지국이 셀 내의 합 전송률에 주는 영향link

Son, In-Hye; 손인혜; et al, 한국과학기술원, 2013

36364
The effectiveness of histogram equalization on environmental model adaptation

Suh, Y.; Kim, HoiRin, 2009 IEEE International Conference on Acoustics, Speech, and Signal Processing, ICASSP 2009, pp.4389 - 4392, 2009-04-19

36365
The effects of the non-discharge pulses to the the wall auxiliary anode type in a DC PDP

Choi, Kyung Cheol, , 1993-10

36366
THE EFFECTS OF ARGON PLASMA TREATMENT ON SILOXANE SOG

PARK, M; LEE, JW; KOO, JG; Yoo, Hyung Joun; JANG, J, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.28, pp.188 - 191, 1995-02

36367
THE EFFECTS OF BJT SELF-HEATING ON CIRCUIT BEHAVIOR

FOX, RM; Lee, Sang-Gug; ZWEIDINGER, DT, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.28, no.6, pp.678 - 685, 1993-06

36368
The effects of cell size on energy saving, system capacity, and per-energy capacity

Leem, H.; Baek, S.Y.; Sung, Dan Keun, IEEE Wireless Communications and Networking Conference 2010, WCNC 2010, IEEE, 2010-04-18

36369
The Effects of Cell Size on Total Power Consumption, Handover, User Density of a Base Station, and Outage Probability

Lim, Youngmi; Lee, Joo Hyung; Choi, JunKyun, ICNS 2011, The Seventh International Conference on Networking and Services, pp.157 - 160, ICNS 2011, The Seventh International Conference on Networking and Services, 2011-05-22

36370
The effects of co-channel interference on spatial diversity techniques

Choi, Wan; Himayat, Nageen; Talwar, Shilpa; Ho, M., IEEE Wireless Communications and Networking Conference, WCNC 2007, pp.1938 - 1943, IEEE, 2007-03-11

36371
The Effects of Electrode Configuration on Body Channel Communication Based on Analysis of Vertical and Horizontal Electric Dipoles

Bae, Joon-Sung; Yoo, Hoi-Jun, IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.63, no.4, pp.1409 - 1420, 2015-04

36372
The effects of electrode impedance on receiver sensitivity in body channel communication

Bae, Joonsung; Yoo, Hoi-Jun, MICROELECTRONICS JOURNAL, v.53, pp.73 - 80, 2016-07

36373
The effects of external optical feedback on the power penalty of DFB-LD modules for 2.5 Gb s(-1) optical transmission systems

Park, KH; Lee, JK; Han, HS; Jang, DH; Park, Chul Soon; Pyun, KE; JICHAI JEONG, OPTICAL AND QUANTUM ELECTRONICS, v.30, no.1, pp.23 - 31, 1998-01

36374
The effects of Ge composition and Si cap thickness on hot carrier reliability of Si/Sil-xGex/Si p-MOSFETs with high-K/metal gate

Loh, W.-Y.; Majhi, P.; Lee, S.-H.; Oh, J.-W.; Sassman, B.; Young, C.; Bersuker, G.; et al, 2008 Symposium on VLSI Technology Digest of Technical Papers, VLSIT, pp.56 - 57, 2008-06-17

36375
THE EFFECTS OF REACTION PARAMETERS ON THE DEPOSITION CHARACTERISTICS IN AL2O3 CVD

Park, Chul Soon; Kim, JG; Chun, JS, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, v.1, no.4, pp.1820 - 1824, 1983-10

36376
The Effects of Spatial Correlation on Multiple Antenna Techniques with Multiuser Scheduling

Kim, Haelyong; Choi, Wan; Park, Hyuncheol, IEICE TRANSACTIONS ON COMMUNICATIONS, v.E94-B, no.2, pp.591 - 594, 2011-02

36377
The effects of the handset case, battery, and human head on the performance of a triple-band internal antenna

Sim, D.-U.; Park, SeongOok, IEEE Antennas and Propagation Society Symposium 2004 Digest held in Conjunction with: USNC/URSI National Radio Science Meeting, v.2, pp.1951 - 1954, 2004-06-20

36378
THE EFFECTS OF X-RAY IRRADIATION-INDUCED DAMAGE ON RELIABILITY IN MOS STRUCTURES

KIM, S; LEE, H; HAN, CH; Lee, Kwyro; CHOI, S; JEON, Y; DIFABRIZIO, E; et al, SOLID-STATE ELECTRONICS, v.38, no.1, pp.95 - 99, 1995-01

36379
The Efficacy of Metal-Interfacial Layer-Semiconductor Source/Drain Structure on Sub-10-nm n-Type Ge FinFET Performances

Kim, Jeong-Kyu; Kim, Gwang-Sik; Nam, Hyohyun; Shin, Changhwan; Park, Jin-Hong; Kim, Jong-Kook; Cho, Byung-Jin; et al, IEEE ELECTRON DEVICE LETTERS, v.35, no.12, pp.1185 - 1187, 2014-12

36380
The efficient clock-extraction methods of NRZ signal for chromatic dispersion monitoring

Kim, SM; Lee, Chang-Hee, IEEE PHOTONICS TECHNOLOGY LETTERS, v.17, pp.1100 - 1102, 2005-05

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