Browse "School of Electrical Engineering(전기및전자공학부)" by Title 

Showing results 32221 to 32240 of 50972

32221
Reliability issue related to dielectric charging in Capacitive Micromachined Ultrasonic Transducers: a review

Munir, Junaid; Ain, Quratul; Lee, Hyunjoo Jenny, MICROELECTRONICS RELIABILITY, v.92, pp.155 - 167, 2019-01

32222
Reliability issues in multi-gate FinFETs

Choi, Yang-Kyu; Han, J.-W.; Lee, H., ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, pp.1101 - 1104, 2006-10-23

32223
Reliability of Barrier Ribs in a Flexible Photoluminescent Display

Choi, Kyung Cheol; Jang, C; Kim, SH; Kim, KJ; Ahn, SI, Material Research Society, 2009-11-30

32224
Reliability of BCB Passivated InAlAs/InGaAs HEMTs Under Thermal Stress

Kim, D; Yoon, M; Kim, T; Yang, Kyounghoon, IEEE, International Symposium on Compound Semiconductors, pp.231 - 232, IEEE, 2003

32225
Reliability of High Dielectric Ba0.5Sr0.5TiO3 Capacitors Using Iridium Electrode

Lee, Hee Chul; S.Y.Cha; B.T.Jang, INTEGRATED FERROELECTRICS, v.24, no.1-4, pp.45 - 55, 1999-01

32226
Reliability of high dielectric Ba0.5Sr0.5TiO3 ferroelectrics

Lee, Hee Chul, pp.0 - 0, 1999-02-01

32227
Reliability of thin gate oxides irradiated under X-ray lithography conditions

Cho, Byung Jin; Kim, SJ; Ang, CH; Ling, CH; Joo, MS; Yeo, IS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.40, no.4B, pp.2819 - 2822, 2001-04

32228
Reliability study and effect of NH3 annealing on the electrical characteristics of polysilicon thin film transistors = 다결정 실리콘 박막 트랜지스터의 신뢰성 연구 및 암모니아 열처리가 전기적 특성에 미치는 영향link

Choi, Duk-Sung; 최득성; et al, 한국과학기술원, 1995

32229
Reliability Study of CMOS FinFETs

Choi, Yang-Kyu; Ha, Daewon; Snow, Eric; Bokor, Jeffrey; King, Tsu-Jae, IEEE, pp.177 - 180, IEEE, 2003-12

32230
Reliable Data Generation using Stereo Camera for a Mobile Robot

Ha, Jong Hyo; Chung, Myung Jin, The 43rd KIEE Summer Annual Conference, KIEE, 2012-07

32231
Reliable Actual Fabric-Based Organic Light-Emitting Diodes: Toward a Wearable Display

Kim, Woohyun; Kwon, Seonil; Han, Yun Cheol; Kim, Eungtaek; Choi, Kyung Cheol; Kang, Sin-Hyeok; Park, Byoung-Cheul, Advanced Electronic Materials, v.2, no.11, 2016-11

32232
Reliable and Long-Lasting Solution-Processed Organic Light-Emitting Diodes with Flexible Multilayer Encapsulation

Kim, Hyuncheol; Kwon, Seonil; Jeon, Yongmin; Choi, Seungyeop; Kwon, Jeong Hyun; Choi, Kyung Cheol, IMID 2017, IMID, 2017-08

32233
Reliable artificial leaky integrate and fire (LIF) neuron device using 2D material

Ahn, Wonbae; Ham, Ayoung; Oh, Jungyeop; Kang, Kibum; Choi, Sung-Yool, The 12th International Workshop on 2D Materials (A3 Workshop), Nanjing university, 2023-07-20

32234
Reliable control via additive redundant adaptive controller

Kim, Byung Kook; Cho, YC; Bien, Z, 1989 American Control Conference, 1989-06

32235
RELIABLE CONTROL VIA AN ADDITIVE REDUNDANT CONTROLLER

CHO, YJ; Bien, Zeung nam, INTERNATIONAL JOURNAL OF CONTROL, v.50, no.1, pp.385 - 398, 1989-07

32236
Reliable controller structures using triple modular redundancy

Kim, Byung Kook; Kwak, Seong Woo, Proceedings of ITC-CSCC, pp.1185 - 1188, 1998-07

32237
Reliable controller structures using triple modular redundancy and their reliability analyses

Kim, Byung Kook; Kwak, Seong Woo, Proceedings of ITC-CSCC '98, pp.1185 - 1188, 1998-07

32238
Reliable doping and carrier concentration control in graphene by aerosol-derived metal nanoparticles

Lee, Jong-Kwon; Sung, Hyangki; Jang, Min Seok; Yoon, Heetae; Choi, Mansoo, JOURNAL OF MATERIALS CHEMISTRY C, v.3, no.32, pp.8294 - 8299, 2015

32239
Reliable Estimation of Respiration Rate Using UWB Impulse Radar

Kang, Jae-Mo; Lim, Dong Woo; Lee, Jae Hwan; In, Changdon; Kim, Hyung-Myung; Woo, Sung-Chul; Kim, Cheonsoo, 2013 Asia-Pacific Microwave Conference, pp.997 - 999, Korean Institute of Electromagnetic Engineering and Science, 2013-11-07

32240
Reliable Fabric-based Organic Light-Emitting Diodes

Choi, Kyung Cheol; Kwon, Seonil; Kim, Woohyun; Kim, Hyuncheol; Choi, Seungyeop, International Conferences on Modern Materials and Technologies, Conferences Internationales Materiaux Et Technologies, 2016-06

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