Browse "School of Electrical Engineering(전기및전자공학부)" by Title 

Showing results 27601 to 27620 of 51627

27601
Noise coupling analysis of power distribution network and signal traces in high-speed system on package (SoP) = 고속 패키지 내 시스템 (SoP) 에서 전력 분배 연결망과 신호선 사이의 노이즈 간섭 분석link

Kim, Jin-Gook; 김진국; et al, 한국과학기술원, 2006

27602
Noise Coupling Effects on CMOS Analog-to-Digital Converter in Magnetic Field Wireless Power Transfer System Using Chip-PCB Comodeling and Simulation

Kim, Joung-Ho; Bae, Bumhee; Kim, Jonghoon; Kim, Suk Jin; Kong, Sunkyu, IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.57, no.3, pp.329 - 338, 2015-06

27603
Noise coupling emulation between TSV and active circuit through metal oxide patch

Kim, Joungho; Jonghyun Cho; Jaemin Lim, 65th Electronic Components and Technology Conference (ECTC), 65th Electronic Components and Technology Conference (ECTC), 2015-05-28

27604
Noise Coupling Modeling and Analysis of Through Glass Via(TGV)

Kim, Joungho; Kim, Jihye; Kim, Youngwoo; Cho, Jonghyun; Venky Sundaram; Rao Tummala, IEEE International 3D Systems Integration Conference (3DIC), IEEE International 3D Systems Integration Conference (3DIC), 2015-08-31

27605
Noise Coupling of Through-Via in Silicon and Glass Interposer

Kim, Joungho; Manho Lee; Jonghyun Cho; Joohee Kim; Jiseong Kim, ECTC Conference, ECTC Conference, 2012-05-29

27606
Noise Coupling of Through-Via in Silicon and Glass Interposer

Kim, Joungho; Jonghyun Cho; Joohee Kim; Jiseoung Kim, 63rd Electronic Components and Technology Conference (ECTC), pp.1806 - 1810, ECTC2013, 2013-05-19

27607
Noise coupling to signal trace and via from power/ground simultaneous switching noise in high speed double data rates memory module

Park, J.; Kim, H.; Pak, J.S.; Jeong, Y.; Baek, S.; Kim, Joungho; Lee, J.-J.; et al, 2004 International Symposium on Electromagnetic Compatibility, EMC 2004, pp.592 - 597, IEEE, 2004-08-09

27608
NOISE DISTRIBUTION CHANGE BY GAIN-SATURATED SEMICONDUCTOR OPTICAL AMPLIFIER

Moon, Sang-Rok; Yoo, Sang-Hwa; Kye, Myeong-Gyun; Lee, Chang-Hee, OptoElectronics and Optical Communications Conference (OECC), pp.748 - 749, OECC, 2014-07-06

27609
Noise figure degradation analysis of power/ground noise on 900MHz LNA for UHF RFID

Koo, K.; Park, H.; Shim, Y.; Kim, Joungho, 9th Electronics Packaging Technology Conference, EPTC 2007, pp.416 - 420, IEEE, 2007-12-12

27610
Noise generation, coupling, isolation, and EM raidaiton in high-speed package and PCB

Kim, Joungho; Pak, J.; Park, J.; Kim, H., IEEE International Symposium on Circuits and Systems 2005, ISCAS 2005, pp.5766 - 5769, IEEE, 2005-05-23

27611
NOISE IN A THIN METALLIC MEDIUM - THE CONNECTION WITH NONLINEAR BEHAVIOR

MELAS, M; ARNETT, P; Moon, Jaekyun, IEEE TRANSACTIONS ON MAGNETICS, v.24, no.6, pp.2712 - 2714, 1988-11

27612
Noise isolation design, analysis, and verification of T-DMB stacked SiP = T-DMB 적층형 시스템-인-패키지에서의 잡음격리설계와 분석 및 검증link

Ha, Myung-Hyun; 하명현; et al, 한국과학기술원, 2007

27613
Noise isolation in LTCC-based X/Ku-band transceiver SiP using double-stacked electromagnetic bandgap structure

Park, J.; Kim, J.; Lu A.C.W.; Shim, Y.; Kim, Joungho, IEEE International Symposium on Electromagnetic Compatibility, EMC 2007, pp.1 - 6, IEEE, 2007-07-09

27614
Noise isolation modeling and experimental validation of power distribution network in chip-package

Park, H.; Yoon, C.; Koo, K.; Kim, Joungho, IEEE International Symposium on Electromagnetic Compatibility, EMC 2007, pp.1 - 6, IEEE, 2007-07-09

27615
Noise Isolation Modeling of Partial EBG Power Bus using Segmentation Method and Cavity Model in Multi-layer PCBs

Kim, Myunghoi; Koo, Kyoungchoul; Kim, Joungho, 2011 IEEE Electromagnetic Compatibility Symposium, 2011 IEEE Electromagnetic Compatibility Symposium, 2011-08-17

27616
Noise parameter extraction of a GaAs MESFET with Monte-Carlo simulation

Baek, JY; Kwon, YS; Hong, Songcheol, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.36, no.3B, pp.1862 - 1865, 1997-03

27617
Noise Parameter Extraction of GaAs MESFET with Monte-Carlo Simulation

Hong, Songcheol; Back, JM; Kwon, YS, SSDM, pp.580 - 582, 1996

27618
Noise Parameter Extraction of GaAs MESFET with Monte-Carlo Simulation.

Kwon, Young Se, ICSSDM(Yokohama,Japan), pp.233 - 235, 1996

27619
Noise Performances of Pseudomorphic A1GaAs/InGaAs/GaAs HEMTs with Wide Head T-Shaped Gate Recessed by ECR Plasma Etching

Park, Chul Soon, JAPANESE JOURNAL OF APPLIED PHYSICS, v.38, no.2, pp.654 - 657, 1999-02

27620
Noise property of a quadrature balanced VCO

Ko, S; Hong, Songcheol, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.15, no.10, pp.673 - 675, 2005-10

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