Showing results 1 to 2 of 2
Electrical evaluation of laser annealed junctions by Hall measurements Poon CH; Tan LS; Cho, Byung Jin; Ng KT; Bhat M; Chan L, THIN SOLID FILMS, v.462, pp.72 - 75, 2004-09 |
Laser annealing of silicon nanocrystal films formed by pulsed-laser deposition Tan, CF; Chen, XY; Lu, YF; Wu, YH; Cho, Byung Jin; Zeng, JN, JOURNAL OF LASER APPLICATIONS, v.16, no.1, pp.40 - 45, 2004-02 |
Discover