Browse "School of Electrical Engineering(전기및전자공학부)" by Subject hafnium aluminum oxide

Showing results 2 to 2 of 2

2
Over-erase phenomenon in SONOS-type flash memory and its minimization using a hafnium oxide-charge storage layer

Tan, YN; Chim, WK; Cho, Byung Jinresearcher; Choi, WK, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.51, no.7, pp.1143 - 1147, 2004-07

Discover

Type

. next

Open Access

Date issued

Subject

. next

rss_1.0 rss_2.0 atom_1.0