Browse "School of Electrical Engineering(전기및전자공학부)" by Subject visible line/surface algorithms

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1
A Memory-Efficient Unified Early Z-Test

Kim, Hong-Yun; Yu, Chang-Hyo; Kim, Lee-Supresearcher, IEEE TRANSACTIONS ON VISUALIZATION AND COMPUTER GRAPHICS, v.17, no.9, pp.1286 - 1294, 2011-09

2
(An) area efficient unified early Z-test for embedded 3D graphics processor = 임베디드 3D 그래픽스 프로세서에 적합한 통합 early Z-test 방법link

Kim, Hong-Yun; 김홍윤; et al, 한국과학기술원, 2008

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