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Derivation of drain current thermal noise for short-channel MOSFETs including the velocity saturation effect Han, K; Lee, Kwyro; Shin, H, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.44, pp.97 - 102, 2004-01 |
Drain current thermal noise modeling for deep submicron n- and p-channel MOSFETs Han K.; Lee, Kwyro; Shin H., SOLID-STATE ELECTRONICS, v.48, no.12, pp.2255 - 2262, 2004-12 |
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