Browse "School of Electrical Engineering(전기및전자공학부)" by Subject velocity saturation
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| Analytical drain thermal noise current model valid for deep submicron MOSFETs Han, Kwang-Seok; Shin, Hyung-Cheol; Lee, Kwy-Ro, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.51, pp.261 - 269, 2004-02 |
| Quasi-3-D velocity saturation model for multiple-gate MOSFETs Han, Jin-Woo; Lee, Choong-Ho; Park, Donggun; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.54, no.5, pp.1165 - 1170, 2007-05 |
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