Browse "School of Electrical Engineering(전기및전자공학부)" by Subject gate electrode
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| Bistable memory and logic-gate devices fabricated by intercrossed stacking of graphene-ferroelectric hybrid ribbons Kim, Woo-Young; Kim, Hyeon-Don; Jeon, Gwang-Jae; Kang, In-Ku; Shim, Hyun Bin; Kim, Tae-Hyo; Lee, Hee Chul, MICRO & NANO LETTERS, v.11, no.7, pp.356 - 359, 2016-07 |
| Fluorine Effects Originating from the CVD W Process on Charge-Trap Flash Memory Cells Moon, Jung Min; Lee, Tae Yoon; Ahn, Hyunjun; Lee, Tae In; Hwang, Wan Sik; Cho, Byung-Jin, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.66, no.1, pp.378 - 382, 2019-01 |
| In-depth study of reliability for charge-trap-type flash memory devices = 전하포획형 플래시 메모리 소자의 신뢰성에 관한 심층 연구link Park, Jong-Kyung; 박종경; et al, 한국과학기술원, 2014 |
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