Showing results 1 to 3 of 3
A Novel Charge Pumping Technique With Gate-Induced Drain Leakage Current Lee, Geon-Beom; Kim, Jeong-Yeon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.44, no.5, pp.709 - 712, 2023-05 |
Effects of Si/SiO2 interface stress on the performance of ultra-thin-body field effect transistors: A first-principles study Jung, Hyo Eun; Shin, Mincheol, NANOTECHNOLOGY, v.29, no.2, 2018-01 |
Graphene Gate Electrode for MOS Structure-Based Electronic Devices Park, Jong-Kyung; Song, Seung-Min; Mun, Jeong-Hun; Cho, Byung-Jin, NANO LETTERS, v.11, no.12, pp.5383 - 5386, 2011-12 |
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