Browse "School of Electrical Engineering(전기및전자공학부)" by Subject fault robustness
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| Analyzing the Storage Defects From the Perspective of Synthetic Fault Injection Yoo, Balgeun; Lee, Seongjin; Won, Youjip, JOURNAL OF INFORMATION SCIENCE AND ENGINEERING, v.34, no.1, pp.1 - 20, 2018-01 |
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