Browse "School of Electrical Engineering(전기및전자공학부)" by Subject endurance reliability
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| Endurance reliability of multilevel-cell flash memory using a ZrO2/Si3N4 dual charge storage layer Zhang, G; Hwang, WS; Lee, SH; Cho, Byung Jin; Yoo, WJ, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.55, no.9, pp.2361 - 2369, 2008-09 |
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