Browse "School of Electrical Engineering(전기및전자공학부)" by Subject early z-test

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An area efficient early Z-test method for 3-D graphics rendering hardware

Yu, CH; Kirn, D; Kim, Lee-Supresearcher, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.55, pp.1929 - 1938, 2008-08

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