Browse "School of Electrical Engineering(전기및전자공학부)" by Subject drain leakage current

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Low leakage and high performance of nMOSFET using SiGe layer as a diffusion barrier

Mheen, B; Song, YJ; Kang, JY; Shim, KH; Hong, Songcheolresearcher, MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, v.7, no.4-6, pp.375 - 378, 2004-08

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