Browse "School of Electrical Engineering(전기및전자공학부)" by Subject charge-trap flash memory

Showing results 1 to 1 of 1

1
Electro-Thermal Erasing at 10(4)-Fold Faster Speeds in Charge-Trap Flash Memory

Kim, Myung-Su; Ahn, Dae-Chul; Park, Jun-Young; Seo, Myungsoo; Kim, Seong-Yeon; Kim, Wu-Kang; Yun, Dae-Hwan; et al, IEEE ELECTRON DEVICE LETTERS, v.40, no.2, pp.196 - 199, 2019-02

Discover

Type

. next

Open Access

Date issued

. next

Subject

. next

rss_1.0 rss_2.0 atom_1.0