Browse "School of Electrical Engineering(전기및전자공학부)" by Subject charge-trap flash memory
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| Electro-Thermal Erasing at 10(4)-Fold Faster Speeds in Charge-Trap Flash Memory Kim, Myung-Su; Ahn, Dae-Chul; Park, Jun-Young; Seo, Myungsoo; Kim, Seong-Yeon; Kim, Wu-Kang; Yun, Dae-Hwan; et al, IEEE ELECTRON DEVICE LETTERS, v.40, no.2, pp.196 - 199, 2019-02 |
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