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Analytical drain thermal noise current model valid for deep submicron MOSFETs Han, Kwang-Seok; Shin, Hyung-Cheol; Lee, Kwy-Ro, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.51, pp.261 - 269, 2004-02 |
Drain current thermal noise modeling for deep submicron n- and p-channel MOSFETs Han K.; Lee, Kwyro; Shin H., SOLID-STATE ELECTRONICS, v.48, no.12, pp.2255 - 2262, 2004-12 |
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