Browse "School of Electrical Engineering(전기및전자공학부)" by Subject ZN-DIFFUSION

Showing results 1 to 2 of 2

1
EFFECT OF STRESS SIGN AND FILM THICKNESS ON INTERFACE NUCLEATION OF MISFIT DISLOCATIONS IN STRAINED MULTILAYERS

Park, HyoHoonresearcher; YOO, JB; OH, DK; KIM, JS; Lee, JeongYongresearcher, JOURNAL OF APPLIED PHYSICS, v.75, no.10, pp.4990 - 4993, 1994-05

2
HOMOGENEOUS NUCLEATION OF MISFIT DISLOCATIONS IN STRAINED LAYERS

Park, HyoHoonresearcher; Lee, JeongYongresearcher, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.33, no.6A, pp.3409 - 3414, 1994-06

Discover

Type

. next

Open Access

Date issued

Subject

. next

rss_1.0 rss_2.0 atom_1.0