Browse "School of Electrical Engineering(전기및전자공학부)" by Subject Junction isolation
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| First Demonstration of Junctionless Accumulation-Mode Bulk FinFETs With Robust Junction Isolation Kim, Tae Kyun; Kim, Dong Hyun; Yoon, Young Gwang; Moon, Jung Min; Hwang, Byeong Woon; Moon, Dong-Il; Lee, Gi Seong; et al, IEEE ELECTRON DEVICE LETTERS, v.34, no.12, pp.1479 - 1481, 2013-12 |
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