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Structural defects and electrical conductivity in nanocrystalline SiC : H films doped with boron and grown by photostimulated chemical-vapor deposition Shevaleevskiy, OI; Myong, SY; Lim, Koeng Su; Miyajima, S; Konagai, M, SEMICONDUCTORS, v.39, no.6, pp.709 - 711, 2005 |
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