Browse "School of Electrical Engineering(전기및전자공학부)" by Subject HAFNIUM OXIDE

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Effects of high pressure nitrogen annealing on ferroelectric Hf0.5Zr0.5O2 films

Kim, Taeho; Park, Jinsung; Cheong, Byoung-Ho; Jeon, Sanghunresearcher, APPLIED PHYSICS LETTERS, v.112, no.9, 2018-03

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