Browse "School of Electrical Engineering(전기및전자공학부)" by Subject Fringing field
Showing results 1 to 2 of 2
| Investigation of gate length and fringing field effects for program and erase efficiency in gate-all-around SONOS memory cells Kim, Moon-Seok; Choi, Sung-Jin; Moon, Dong-Il; Duarte, Juan P.; Kim, Sung-Ho; Choi, Yang-Kyu, SOLID-STATE ELECTRONICS, v.79, pp.7 - 10, 2013-01 |
| Origin of Device Performance Enhancement of Junctionless Accumulation-Mode (JAM) Bulk FinFETs With High-kappa Gate Spacers Choi, Ji Hun; Kim, Tae Kyun; Moon, Jung Min; Yoon, Young Gwang; Hwang, Byeong Woon; Kim, Dong Hyun; Lee, Seok-Hee, IEEE ELECTRON DEVICE LETTERS, v.35, no.12, pp.1182 - 1184, 2014-12 |
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