Browse "School of Electrical Engineering(전기및전자공학부)" by Subject EXPOSURES

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Radiometric Calibration by Rank Minimization

Lee, Joon-Young; Matsushita, Yasuyuki; Shi, Boxin; Kweon, In Soresearcher; Ikeuchi, Katsushi, IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, v.35, no.1, pp.144 - 156, 2013-01

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