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Sequential Locally Optimum Test (SLOT): A Sequential Detection Scheme Based on Locally Optimum Test Statistic

Bae, Jin-Soo; Park, Seong-Ill; Kim, Yun-Hee; Yoon, Seok-Ho; Oh, Jong-Ho; Song, Iickho; Oh, Seong-Jun, IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, v.E93A, no.11, pp.2045 - 2056, 2010-11

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