Browse "School of Electrical Engineering(전기및전자공학부)" by Subject 1/F NOISE

Showing results 1 to 7 of 7

1
Abnormal electrical characteristics of multi-layered MoS2 FETs attributed to bulk traps

Kim, Choong-Ki; Yu, Chan Hak; Hur, Jae; Bae, Hagyoul; Jeon, Seung-Bae; Park, Hamin; Kim, Yong Min; et al, 2D MATERIALS, v.3, no.1, pp.015007, 2016-03

2
Enhanced bolometric properties of nickel oxide thin films for infrared image sensor applications by substitutional incorporation of Li

Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Kim, Woo Young; Lee, Hee Chulresearcher, CERAMICS INTERNATIONAL, v.44, no.7, pp.7808 - 7813, 2018-05

3
Feasibility Study of Extended-Gate-Type Silicon Nanowire Field-Effect Transistors for Neural Recording

Kang, Hongki; Kim, Jee-Yeon; Choi, Yang-Kyuresearcher; Nam, Yoonkeyresearcher, SENSORS, v.17, no.4, 2017-04

4
Graphene electrode with tunable charge transport in thin-film transistors

Park, Ick Joon; Kim, Tae In; Cho, In-Tak; Song, Chang-Woo; Yang, Ji-Woong; Park, Hongkeun; Cheong, Woo-Seok; et al, NANO RESEARCH, v.11, no.1, pp.274 - 286, 2018-01

5
Low frequency noise in GaAs structures with embedded In(Ga)As quantum dots

Lee, JI; Nam, HD; Choi, WJ; Yu, BY; Song, JD; Hong, Songcheolresearcher; Noh, SK; et al, CURRENT APPLIED PHYSICS, v.6, no.6, pp.1024 - 1029, 2006-10

6
Low-Frequency Noise Performance of a Bilayer InZnO-InGaZnO Thin-Film Transistor for Analog Device Applications

Jeon, Sanghunresearcher; Kim, Sun Il; Park, Sungho; Song, Ihun; Park, Jaechul; Kim, Sangwook; Kim, Changjung, IEEE ELECTRON DEVICE LETTERS, v.31, no.10, pp.1128 - 1130, 2010-10

7
Quantitative Analysis of Deuterium Annealing Effect on Poly-Si TFTs by Low Frequency Noise and DC I-V Characterization

Kim, Dohyun; Lim, Sung Kwan; Bae, Hagyoul; Kim, Choong-Ki; Lee, Seung-Wook; Seo, Myungsoo; Kim, Seong-Yeon; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.4, pp.1640 - 1644, 2018-04

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