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Conduction and Low-Frequency Noise Analysis in Al/alpha-TiOX/Al Bipolar Switching Resistance Random Access Memory Devices

Lee, Jung-Kyu; Jeong, Hu Young; Cho, In-Tak; Lee, JeongYongresearcher; Choi, Sung-Yoolresearcher; Kwon, Hyuck-In; Lee, Jong-Ho, IEEE ELECTRON DEVICE LETTERS, v.31, no.6, pp.603 - 605, 2010-06

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