Browse "School of Electrical Engineering(전기및전자공학부)" by Author Tae Hyun Yoon
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| In situ scanning transmission X-ray microscopy study on bipolar resistive switching mechanism of Al/GO/Al RRAM device Jong Yun Kim; Hyun Woo Nho; Jian Wang; Hyun-Joon Shin; Choi, Sung-Yool; Tae Hyun Yoon, BAMN 2013, BAMN 2013, 2013-08-26 |
| Interfacial reaction in graphene oxide RRAM device probed by scanning transmission X-ray microscopy Jong Yun Kim; Hyun Woo Nho; Jin Bae Kim; Jian Wang; Hyun-Joon Shin; Tae Hyun Yoon; Choi, Sung-Yool, NANO KOREA 2013, NANO KOREA 2013, 2013-07-12 |
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