Browse "School of Electrical Engineering(전기및전자공학부)" by Author B.T.Jang

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Reliability of High Dielectric Ba0.5Sr0.5TiO3 Capacitors Using Iridium Electrode

Lee, Hee Chul; S.Y.Cha; B.T.Jang, INTEGRATED FERROELECTRICS, v.24, no.1-4, pp.45 - 55, 1999-01

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