Browse "School of Electrical Engineering(전기및전자공학부)" by Author Youn, Joong Suk

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Modeling, Measurement, and Analysis of TSV Channel and Defects for 2.5D/3D IC Failure Analysis

Kim, Jounghoresearcher; Jung, Daniel H; Bae, Hyun-Cheol; Choi, Kwang-Seong; Youn, Joong Suk, DesignCon 2017, DesignCon 2017, 2017-02-01

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