Browse "School of Electrical Engineering(전기및전자공학부)" by Author Yoon, Jae Seok

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Influence of High-Pressure Annealing on Memory Properties of Hf0.5Zr0.5O2 Based 1T-FeRAM

Yoon, Jae Seok; Tewari, Amit; Shin, Changhwan; Jeon, Sanghunresearcher, IEEE ELECTRON DEVICE LETTERS, v.40, no.7, pp.1076 - 1079, 2019-07

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