Browse "School of Electrical Engineering(전기및전자공학부)" by Author Yoon, Hee Bang

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1

Multi-layer Probe Card Design with Signal/Power Integrity for Wafer-level AP Test in LPDDR4 Channel

Song, Jinwook; Kim, Jounghoresearcher; Lee, Eunjung; Kim, Jonghoon; Park, Shinyoung; Park, Jeoung Keun; Park, Jong Hyun; et al, IEEE International Conference on Signal and Power Integrity (SIPI 2016), IEEE International Conference on Signal and Power Integrity (SIPI 2016), 2016-07-27

2

Probe Card Design with Signal and Power Integrity for Wafer-level Application Processor Test in LPDDR Channel

Kim, Jounghoresearcher; Song, Jinwook; Lee, Eunjung; Kim, Jonghoon; Park, Shinyoung; Park, Jeoung Keun; Park, Jong Hyun; et al, 66th Electronic Components and Technology Conference (ECTC), 66th Electronic Components and Technology Conference (ECTC), 2016-05-31

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