Browse "School of Electrical Engineering(전기및전자공학부)" by Author Yoon, Changwook

Showing results 1 to 7 of 7

1
A 6.4Gbps On-chip Eye Opening Monitor Circuit for Signal Integrity Analysis of High Speed Channel

Kim, Jounghoresearcher; Shin, Mincheol; Shim, Jongjoo; Kim, Jaemin; Pak, Jun So; Hwang, Chulsoon; Yoon, Changwook; et al, Presented at Proceeding of 2008 IEEE EMC Symposium, pp.1 - 7, 2008-08

2
A Noise Coupling Effect on Reference Voltage Level of Triggering Circuit in Non-coherent UWB Communication System

Kim, Jounghoresearcher; Yoon, Changwook; Shin, Minchul; Shim, Yujeong; Kim, Myunghoi; Cho, Jeonghyeon, EMC Kyoto Symposium, 2009

3
An On-Chip Spectrum Analyzer for Signal Integrity

Kim, Jounghoresearcher; Cho, Jeonghyeon; Lee, Woojin; Song, Eakhwan; Shim, Jongjoo; Shin, Minchul; Yoon, Changwook, EMC Kyoto Symposium, 2009

4
Analysis of DLL Jitter Affected by Power Supply Noise on Power Distribution Network

Kim, Jounghoresearcher; Shin, Minchul; Yoon, Changwook; Cho, Jeonghyeon; Shim, Jongjoo; Shim, Yujeong, EMC Kyoto Symposium, 2009

5
On-Chip Linear Voltage Regulator Module (VRM) Effect on Power Distribution Network (PDN) Noise and Jitter at High-Speed Output Buffer

Kim, Jounghoresearcher; Kim, Sukjin; Yoon, Changwook; Kim, Jingook; Brice Achkir; Jun Fan, 2015 IEEE Sympositum on Electromagnetic Compatibility & Signal Integrity, 2015 IEEE Sympositum on Electromagnetic Compatibility & Signal Integrity, 2015-03-15

6
On-chip Voltage Regulator Module (VRM) Effect on Power/Ground Noise and Jitter at High-speed Output Buffer

Kim, Joung-Horesearcher; Kim, Heegon; Yoon, Changwook; Kim, Jingook; Brice Achkir, 2014 IEEE International Symposium on Electromagnetic Compatibility(EMC&SIPI), 2014 IEEE International Symposium on Electromagnetic Compatibility(EMC&SIPI), 2014-08-03

7
Power/ground Noise Immunity Test in Wireless and High-speed UWB Communication System

Kim, Jounghoresearcher; Yoon, Changwook; Park, Hyunjeong; Lee, Woojin; Shin, Minchul; Pak, Jun So, IEEE Electromagnetic Compatibility Symposium, EMC, pp.1 - 6, 2008

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