Browse "School of Electrical Engineering(전기및전자공학부)" by Author Yook, Jong-Min

Showing results 1 to 8 of 8

1
30 Gbps High-Speed Characterization and Channel Performance of Coaxial Through Silicon Via

Jung, Daniel Hyunsuk; Kim, Hee-Gon; Kim, Suk Jin; Kim, Jonghoon J.; Bae, Bumhee; Kim, Jonghoon; Yook, Jong-Min; et al, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.24, no.11, pp.814 - 816, 2014-11

2
Air-Cavity Transmission Lines on Anodized Aluminum for High-Performance RF Modules

Yook, Jong-Min; Kim, Kyoung-Min; Kwon, Young Seresearcher, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.19, no.10, pp.623 - 625, 2009-10

3
High-frequency Measurements of TSV failures

Kim, Joohee; Cho, Jonghyun; Pak, Jun So; Kim, Jounghoresearcher; Yook, Jong-Min; Kim, Jun Chul, 62nd Electronic Components and Technology Conference (ECTC), 62nd Electronic Components and Technology Conference (ECTC), 2012-05-29

4
High-Frequency Scalable Modeling and Analysis of a Differential Signal Through-Silicon Via

Kim, Joo-Hee; Cho, Jong-Hyun; Kim, Jounghoresearcher; Yook, Jong-Min; Kim, Jun Chul; Lee, Junho; Park, Kunwoo; et al, IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, v.4, no.4, pp.697 - 707, 2014-04

5
High-Freuquency TSV Failure Analysis

Kim, Joohee; Cho, Jonghyun; Jung, Hyunsuk; Pak, Jun So; Yook, Jong-Min; Kim, Jounghoresearcher; Kim, Jun Chul, 20th Conference on Electrical Performance of Electronic Packaging and Systems, EPEP 2011, 2011-10-24

6
RF IPDs (Integrated Passive Devices) and WLAN FEM (Front End Module) on the SAAO (Selectively Anodized Aluminum Oxide) = 양극산화 알루미늄 산화막에 집적된 고주파 수동소자와 무선랜용 프론트 엔드 모듈link

Yook, Jong-Min; 육종민; et al, 한국과학기술원, 2009

7
Spiral inductors using polymer-core conductors

Yook, Jong-Min; Kwon, Young Seresearcher, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.17, no.7, pp.495 - 497, 2007-07

8
Suspended Spiral Inductor and Band-Pass Filter on Thick Anodized Aluminum Oxide

Yook, Jong-Min; Kim, Kyoung-Min; Kwon, Young Seresearcher, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.19, no.10, pp.620 - 622, 2009-10

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