Browse "School of Electrical Engineering(전기및전자공학부)" by Author Yang, XF

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Voltage and temperature dependence of capacitance of high-K hfO2 MIM capacitors: A unified understanding and prediction

Cho, Byung Jinresearcher; Zhu, C; Hu, H; Yang, XF; Kim, SJ; Chin, A, International Electron Device Meeting (IEDM), pp.0 - 0, IEEE International Electron Devices, 2003-12-08

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