Browse "School of Electrical Engineering(전기및전자공학부)" by Author Park, Yongjin

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1
First-Principles Studies of the Electronic and Dielectric Properties of Si/SiO2/HfO2 Interfaces

Park, Yongjin; Kong, Ki-jeong; Chang, Hyunju; Shin, Mincheolresearcher, JAPANESE JOURNAL OF APPLIED PHYSICS, v.52, no.4, pp.041803, 2013-04

2
Interface model for HfO2 gate stack from first principles calculations and its application to nanoscale device simulations

Shin, Mincheolresearcher; Park, Yongjin; Kong, Ki-jeong; Chang, Hyunju, APPLIED PHYSICS LETTERS, v.98, no.17, pp.173501, 2011-04

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