Browse "School of Electrical Engineering(전기및전자공학부)" by Subject trap recovery
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| LF Noise Analysis for Trap Recovery in Gate Oxides Using Built-In Joule Heater Jeon, Chang-Hoon; Kim, Choong-Ki; Park, Jun-Young; Jeong,Ui-Sik; Lee, Byung-Hyun; Kim, Kyung Rok; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.12, pp.5081 - 5086, 2017-12 |
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