Browse "School of Electrical Engineering(전기및전자공학부)" by Subject image quality optimization problems

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DCT-QM: A DCT-Based Quality Degradation Metric for Image Quality Optimization Problems

Bae, Sung-Ho; Kim, Mun-Churl, IEEE TRANSACTIONS ON IMAGE PROCESSING, v.25, no.10, pp.4916 - 4930, 2016-10

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