Browse "School of Electrical Engineering(전기및전자공학부)" by Subject e-field stress compensation
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| Dual-Mechanism Memory Combining Charge Trapping and Polarization Switching for Wide Memory Window Flash Cell Shin, Eui Joong; Lee, Gyusoup; Kim, Seongho; Chu, Jun Hong; Cho, Byung Jin, IEEE ELECTRON DEVICE LETTERS, v.44, no.7, pp.1108 - 1111, 2023-07 |
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