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Low-Temperature Deuterium Annealing to Improve Performance and Reliability in a MOSFET Yu, Ji-Man; Wang, Dong-Hyun; Ku, Ja-Yun; Han, Joon-Kyu; Jung, Dae-Han; Park, Jun-Young; Choi, Yang-Kyu, SOLID-STATE ELECTRONICS, v.197, 2022-11 |
Photo-physics of PTB7, PCBM and ICBA based ternary solar cells Sharma, Ramakant; Lee, Hyunwoo; Gupta, Vinay; Kim, Hoyeon; Kumar, Mahesh; Sharma, Chhavi; Chand, Suresh; et al, ORGANIC ELECTRONICS, v.34, pp.111 - 117, 2016-07 |
Trap의 영향을 고려한 고주파 HEMT 잡음 모델링에 관한 연구 = Microwave HEMT noise modeling considering trap effectslink 황민지; Hwang, Min-Ji; et al, 한국과학기술원, 2005 |
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