Flexible One Diode-One Phase Change Memory Array Enabled by Block Copolymer Self-Assembly

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dc.contributor.authorMun, Beomhoko
dc.contributor.authorYou, Byoungkukko
dc.contributor.authorYang, Se Ryeunko
dc.contributor.authorYoo, Hyeon Gyunko
dc.contributor.authorKim, JongMinko
dc.contributor.authorPark, Woon-Ikko
dc.contributor.authorYin, Youko
dc.contributor.authorByun, Myunghwanko
dc.contributor.authorJung, Yeon-Sikko
dc.contributor.authorLee, Keon-Jaeko
dc.date.accessioned2015-06-04T01:45:13Z-
dc.date.available2015-06-04T01:45:13Z-
dc.date.created2015-05-06-
dc.date.created2015-05-06-
dc.date.created2015-05-06-
dc.date.issued2015-04-
dc.identifier.citationACS NANO, v.9, no.4, pp.4120 - 4128-
dc.identifier.issn1936-0851-
dc.identifier.urihttp://hdl.handle.net/10203/198761-
dc.description.abstractFlexible memory is the fundamental component for data processing, storage, and radio frequency communication in flexible electronic systems. Among several emerging memory technologies, phase-change random-access memory (PRAM) is one of the strongest candidate for next-generation nonvolatile memories due to its remarkable merits of large cycling endurance, high speed, and excellent scalability. Although there are a few approaches for flexible phase-change memory (PCM), high reset current is the biggest obstacle for the practical operation of flexible PCM devices. In this paper, we report a flexible PCM realized by incorporating nanoinsulators derived from a Si-containing block copolymer (BCP) to significantly lower the operating current of the flexible memory formed on plastic substrate. The reduction of thermal stress by BCP nanostructures enables the reliable operation of flexible PCM devices integrated with ultrathin flexible diodes during more than 100 switching cycles and 1000 bending cycles.-
dc.languageEnglish-
dc.publisherAMER CHEMICAL SOC-
dc.subjectLIGHT-EMITTING-DIODES-
dc.subjectNONVOLATILE MEMORY-
dc.subjectDIBLOCK COPOLYMER-
dc.subjectELECTRONICS-
dc.subjectPATTERNS-
dc.subjectSILICON-
dc.subjectLITHOGRAPHY-
dc.subjectNANOSTRUCTURES-
dc.subjectTRANSISTORS-
dc.subjectFABRICATION-
dc.titleFlexible One Diode-One Phase Change Memory Array Enabled by Block Copolymer Self-Assembly-
dc.typeArticle-
dc.identifier.wosid000353867000077-
dc.identifier.scopusid2-s2.0-84928948683-
dc.type.rimsART-
dc.citation.volume9-
dc.citation.issue4-
dc.citation.beginningpage4120-
dc.citation.endingpage4128-
dc.citation.publicationnameACS NANO-
dc.identifier.doi10.1021/acsnano.5b00230-
dc.contributor.localauthorJung, Yeon-Sik-
dc.contributor.localauthorLee, Keon-Jae-
dc.contributor.nonIdAuthorYang, Se Ryeun-
dc.contributor.nonIdAuthorYin, You-
dc.contributor.nonIdAuthorByun, Myunghwan-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorflexible electronics-
dc.subject.keywordAuthorflexible memory-
dc.subject.keywordAuthorone diode-one resistor-
dc.subject.keywordAuthorphase change memory-
dc.subject.keywordAuthorblock copolymers self-assembly-
dc.subject.keywordAuthorflexible electronics-
dc.subject.keywordAuthorflexible memory-
dc.subject.keywordAuthorone diode-one resistor-
dc.subject.keywordAuthorphase change memory-
dc.subject.keywordAuthorblock copolymers self-assembly-
dc.subject.keywordPlusLIGHT-EMITTING-DIODES-
dc.subject.keywordPlusNONVOLATILE MEMORY-
dc.subject.keywordPlusDIBLOCK COPOLYMER-
dc.subject.keywordPlusELECTRONICS-
dc.subject.keywordPlusPATTERNS-
dc.subject.keywordPlusSILICON-
dc.subject.keywordPlusLITHOGRAPHY-
dc.subject.keywordPlusNANOSTRUCTURES-
dc.subject.keywordPlusTRANSISTORS-
dc.subject.keywordPlusFABRICATION-
dc.subject.keywordPlusLIGHT-EMITTING-DIODES-
dc.subject.keywordPlusNONVOLATILE MEMORY-
dc.subject.keywordPlusDIBLOCK COPOLYMER-
dc.subject.keywordPlusELECTRONICS-
dc.subject.keywordPlusPATTERNS-
dc.subject.keywordPlusSILICON-
dc.subject.keywordPlusLITHOGRAPHY-
dc.subject.keywordPlusNANOSTRUCTURES-
dc.subject.keywordPlusTRANSISTORS-
dc.subject.keywordPlusFABRICATION-
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