Structural integrity of intermediate Printed Circuit Heat Exchanger (PCHE) for Sodium-cooled Fast Reactor (SFR) attached to Supercritical CO2 (S-CO2) is investigated. ANSYS-Mechanical was used to simulate stress fields of representative PCHE channels, with temperature fields imported from FLUENT simulation. Mechanical stress induced by pressure loading is found to be the primary source of stress. As plasticity sufficiently lowers local stress concentration at PCHE channel tips, PCHE type intermediate heat exchangers made of SS316 are anticipated to reliably assure compliance with design standards prescribed in the ASME standards, thanks to the structure temperature that is below the effective creep inducing point. The actual life time of PCHE for SFR-SCO2 is likely to be affected by mechanical behavior change of SS316 with reactions with S-CO2 and fatigue.